1. Materials and Reliability Handbook for Semiconductor Optical and Electron Device
Author: / edited by Osamu Ueda, Stephen J. Pearton
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Physics,Electronics,Optical materials,Surfaces (Physics),Electronic books
Classification :
E-BOOK
2. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author: / Osamu Ueda, Stephen J. Pearton
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: INSTRUMENTATION& TESTING|INSTRUMENTS & ELECTRONIC|MATERIALS SCIENCE, CHARACTERIZATION &ENGINEERING, ELECTRICAL
Classification :
E-BOOK
3. Materials and reliability handbook for semiconductor optical and electron devices
Author: /Osamu Ueda, Stephen J. Pearton Editors.
Library: National Library and Archives of Islamic Republic of Iran (Tehran)
Subject: نیمه هادیها,نیمههادیها,مواد اپتیکی, -- دستنامهها, -- دستنامهها,-- دستنامهها, -- مواد صنعتی, -- اطمینانپذیری
Classification :
TK
۷۸۷۱
/
۸۵
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م
۲ ۱۳۹۲
4. Materials and reliability handbook for semiconductor optical and electron devices
Author: Osamu Ueda, Stephen J. Pearton, editors
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Optical materials, Handbooks, manuals, etc,Semiconductors-- Materials, Handbooks, manuals, etc,Semiconductors-- Reliability, Handbooks, manuals, etc
Classification :
TK7871
.
85
.
M38
2013
5. Reliability and degradation of III-V optical devices
Author: Ueda, Osamu
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Gallium arsenide semiconductors - Reliability , Semiconductors - Failures , Light emitting diodes - Reliability , Crystals - Defects
Classification :
TK
7871
.
85
.
U33
1996
6. Reliability and degradation of III-V optical devices
Author: / Osamu Ueda
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Gallium aresnide semiconductors - Reliability,Semiconductors - Failures,Light emitting diodes - Reliability,Crystals - Defects
Classification :
TK
7871
.
85
.
U33
1996
7. Tohoku recovery : challenges, potentials and future
Author: Rajib Shaw, editor
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: ، Fukushima Nuclear Disaster )Japan : 1102(,، Tohoku Earthquake and Tsunami )Japan : 1102(,، Tohoku Earthquake and Tsunami, Japan, 1102,، Fukushima Nuclear Disaster, Japan, 1102,، Disasters - Japan Tطohoku Region,، Disasters,، Tطohoku Region )Japan(,- Tطohoku Region ، Japan
Classification :
T
64
.
R60
2015
